Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis

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Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis

Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis

Theodoros
Dimopoulos
AIT Austrian Institute of Technology
Austria
EMMC ASBL
European Materials Modelling Council
Silversquare Stéphanie
Avenue Louise 54
1050 Brussels
CBE no: 0731 621 312
contact@emmc.eu
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