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Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis
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Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis
Accelerated screening of oxide semiconductors by combinatorial spray deposition and highthroughput analysis
Poster / Presentation
Theodoros
Dimopoulos
AIT Austrian Institute of Technology
Austria
EMMC ASBL
European Materials Modelling Council
Avenue Louise 54
1050 Brussels
CBE no: 0731 621 312
contact@emmc.eu
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